dc.contributor.author | Hu, Min-Chun | |
dc.contributor.author | Gao, Zhan | |
dc.contributor.author | Malagi, Santosh | |
dc.contributor.author | Swenton, Joe | |
dc.contributor.author | Huisken, Jos | |
dc.contributor.author | Goossens, Kees | |
dc.contributor.author | Wu, Cheng-Wen | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.date.accessioned | 2022-01-27T11:39:49Z | |
dc.date.available | 2021-11-02T16:05:40Z | |
dc.date.available | 2022-01-27T11:39:49Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1530-1877 | |
dc.identifier.other | WOS:000615974000011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38222.2 | |
dc.source | WOS | |
dc.title | Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hu, Min-Chun | |
dc.contributor.imecauthor | Gao, Zhan | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.eisbn | 978-1-7281-4312-5 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.conference | 25th IEEE European Test Symposium (ETS) | |
dc.source.conferencedate | MAY 25-29, 2020 | |
dc.source.conferencelocation | Tallinn, Estonia | |
dc.source.journal | na | |
imec.availability | Published - imec | |