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Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
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Authors
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Nyssens, Lucas
;
Halder, Arka
;
Raskin, Jean-Pierre
;
Flandre, Denis
;
Kazemi Esfeh, Babak
DOI
10.1109/JEDS.2021.3057798
ISSN
2168-6734
Issue
1
Journal
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Volume
9
Title
Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
Publication type
Journal article
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2
20.500.12860/37982.2
*
2021-11-25T09:02:50Z
validation by library/open access desk
1
20.500.12860/37982
2021-11-02T16:02:23Z
*Selected version
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