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Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
dc.contributor.author | Kilchytska, Valeriya | |
dc.contributor.author | Makovejev, Sergej | |
dc.contributor.author | Esfeh, Babak Kazemi | |
dc.contributor.author | Nyssens, Lucas | |
dc.contributor.author | Halder, Arka | |
dc.contributor.author | Raskin, Jean-Pierre | |
dc.contributor.author | Flandre, Denis | |
dc.date.accessioned | 2021-11-02T16:02:23Z | |
dc.date.available | 2021-11-02T16:02:23Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2168-6734 | |
dc.identifier.other | WOS:000645060300009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37982 | |
dc.source | WOS | |
dc.title | Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Esfeh, Babak Kazemi | |
dc.contributor.orcidext | Kilchytska, Valeriya::0000-0002-8540-3313 | |
dc.contributor.orcidext | Nyssens, Lucas::0000-0003-3996-7553 | |
dc.contributor.orcidext | Halder, Arka::0000-0002-4809-4902 | |
dc.contributor.orcidext | Flandre, Denis::0000-0001-5298-5196 | |
dc.identifier.doi | 10.1109/JEDS.2021.3057798 | |
dc.source.numberofpages | 11 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 500 | |
dc.source.endpage | 510 | |
dc.source.journal | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | |
dc.source.volume | 9 | |
imec.availability | Under review |
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