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Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
dc.contributor.author | Tyaginov, S. | |
dc.contributor.author | Makarov, A. | |
dc.contributor.author | Chasin, A. | |
dc.contributor.author | Bury, E. | |
dc.contributor.author | Vandemaele, M. | |
dc.contributor.author | Jech, M. | |
dc.contributor.author | Grill, A. | |
dc.contributor.author | De Keersgieter, A. | |
dc.contributor.author | Lintent, D. | |
dc.contributor.author | Kaczer, B. | |
dc.date.accessioned | 2021-11-02T16:02:29Z | |
dc.date.available | 2021-11-02T16:02:29Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1946-1550 | |
dc.identifier.other | WOS:000635636600016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37990 | |
dc.source | WOS | |
dc.title | Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Tyaginov, S. | |
dc.contributor.imecauthor | Chasin, A. | |
dc.contributor.imecauthor | Bury, E. | |
dc.contributor.imecauthor | Vandemaele, M. | |
dc.contributor.imecauthor | Grill, A. | |
dc.contributor.imecauthor | De Keersgieter, A. | |
dc.contributor.imecauthor | Lintent, D. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.identifier.eisbn | ***************** | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) | |
dc.source.conferencedate | JUL 20-23, 2020 | |
dc.source.conferencelocation | Singapore | |
imec.availability | Under review |
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