Publication:

Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

Date

2020
Proceedings Paper
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Author(s)

Makarov, A.
;
Jech, M.
;
Tyaginov, Stanislav  
;
Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
De Keersgieter, An  
;
Linten, Dimitri  
;
Kaczer, Ben  

Journal

na

Abstract

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1811 since deposited on 2021-11-02
Acq. date: 2026-03-17

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1811 since deposited on 2021-11-02
Acq. date: 2026-03-17

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