Publication:

Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

Date

2020
Proceedings Paper
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dc.contributor.authorMakarov, A.
dc.contributor.authorJech, M.
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorBury, Erik
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorGrill, Alexander
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorTyaginov, S.
dc.contributor.imecauthorChasin, A.
dc.contributor.imecauthorBury, E.
dc.contributor.imecauthorVandemaele, M.
dc.contributor.imecauthorGrill, A.
dc.contributor.imecauthorDe Keersgieter, A.
dc.contributor.imecauthorLintent, D.
dc.contributor.imecauthorKaczer, B.
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-11-23T09:33:38Z
dc.date.available2021-11-02T16:02:29Z
dc.date.available2021-11-23T09:33:38Z
dc.date.issued2020
dc.identifier.eisbn*****************
dc.identifier.issn1946-1550
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37990
dc.publisherIEEE
dc.source.conferenceIEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
dc.source.conferencedateJUL 20-23, 2020
dc.source.conferencelocationSingapore
dc.source.journalna
dc.source.numberofpages7
dc.title

Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

dc.typeProceedings paper
dspace.entity.typePublication
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