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Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Publication:
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
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Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Makarov, A.
;
Jech, M.
;
Tyaginov, Stanislav
;
Vaisman Chasin, Adrian
;
Bury, Erik
;
Vandemaele, Michiel
;
Grill, Alexander
;
De Keersgieter, An
;
Linten, Dimitri
;
Kaczer, Ben
Journal
na
Abstract
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Views
1809
since deposited on 2021-11-02
1
last month
1
last week
Acq. date: 2026-01-26
Citations