Publication:

Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

Date

2020
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Makarov, A.
;
Jech, M.
;
Tyaginov, Stanislav  
;
Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
De Keersgieter, An  
;
Linten, Dimitri  
;
Kaczer, Ben  

Journal

na

Abstract

Description

Statistics

Views

1811 since deposited on 2021-11-02
2last month
Acq. date: 2026-02-24

Citations

Statistics

Views

1811 since deposited on 2021-11-02
2last month
Acq. date: 2026-02-24

Citations