dc.contributor.author | Schreurs, Dominique | |
dc.contributor.author | Vandenberghe, S. | |
dc.contributor.author | Nauwelaers, Bart | |
dc.contributor.author | van Meer, Hans | |
dc.contributor.author | Lyu, Jeong-ho | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-14T11:37:35Z | |
dc.date.available | 2021-10-14T11:37:35Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3806 | |
dc.source | IIOimport | |
dc.title | Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Schreurs, Dominique | |
dc.contributor.imecauthor | Nauwelaers, Bart | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.source.peerreview | no | |
dc.source.beginpage | 376 | |
dc.source.endpage | 379 | |
dc.source.conference | ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |