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Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies

dc.contributor.authorSchreurs, Dominique
dc.contributor.authorVandenberghe, S.
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorvan Meer, Hans
dc.contributor.authorLyu, Jeong-ho
dc.contributor.authorKubicek, Stefan
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-14T11:37:35Z
dc.date.available2021-10-14T11:37:35Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3806
dc.sourceIIOimport
dc.titleVersatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDe Meyer, Kristin
dc.source.peerreviewno
dc.source.beginpage376
dc.source.endpage379
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
dc.source.conferencelocation
imec.availabilityPublished - imec


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