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Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation

dc.contributor.authorChasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorLitta, Eugenio
dc.contributor.authorSpessot, Alessio
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorLinten, Dimitri
dc.contributor.authorBen Kaczer
dc.date.accessioned2022-01-20T11:22:36Z
dc.date.available2021-11-02T16:05:23Z
dc.date.available2022-01-20T11:22:36Z
dc.date.issued2020
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000612717200167
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38209.2
dc.sourceWOS
dc.titleRelevance of fin dimensions and high-pressure anneals on hot-carrier degradation
dc.typeProceedings paper
dc.contributor.imecauthorChasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorLitta, Eugenio
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorBen Kaczer
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.identifier.eisbn978-1-7281-3199-3
dc.source.numberofpages6
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationDallas, TX, USA
dc.source.journalna
imec.availabilityUnder review


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VersionItemDateSummary
320.500.12860/38209.32022-01-20T11:25:22Zvalidation by library/open access desk
220.500.12860/38209.2*2021-11-30T09:02:24Zvalidation by imec author
120.500.12860/382092021-11-02T16:05:23Z

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