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Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
dc.contributor.author | Putcha, V | |
dc.contributor.author | Bury, E. | |
dc.contributor.author | Franco, J. | |
dc.contributor.author | Walke, A. | |
dc.contributor.author | Zhao, S. E. | |
dc.contributor.author | Peralagu, U. | |
dc.contributor.author | Zhao, M. | |
dc.contributor.author | Alian, A. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Waldron, N. | |
dc.contributor.author | Linten, D. | |
dc.contributor.author | Parvais, B. | |
dc.contributor.author | Collaert, N. | |
dc.date.accessioned | 2021-11-02T16:05:23Z | |
dc.date.available | 2021-11-02T16:05:23Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200120 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38212 | |
dc.source | WOS | |
dc.title | Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Putcha, V | |
dc.contributor.imecauthor | Bury, E. | |
dc.contributor.imecauthor | Franco, J. | |
dc.contributor.imecauthor | Walke, A. | |
dc.contributor.imecauthor | Peralagu, U. | |
dc.contributor.imecauthor | Zhao, M. | |
dc.contributor.imecauthor | Alian, A. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.contributor.imecauthor | Waldron, N. | |
dc.contributor.imecauthor | Linten, D. | |
dc.contributor.imecauthor | Parvais, B. | |
dc.contributor.imecauthor | Collaert, N. | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
imec.availability | Under review |
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