dc.contributor.author | Wuytens, Robin | |
dc.contributor.author | Santermans, Sybren | |
dc.contributor.author | Gupta, Mihir | |
dc.contributor.author | Du Bois, Bert | |
dc.contributor.author | Severi, Simone | |
dc.contributor.author | Lagae, Liesbet | |
dc.contributor.author | Van Roy, Wim | |
dc.contributor.author | Martens, Koen | |
dc.date.accessioned | 2021-11-23T11:11:41Z | |
dc.date.available | 2021-11-02T16:05:23Z | |
dc.date.available | 2021-11-23T11:11:41Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200099 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38213.2 | |
dc.source | WOS | |
dc.title | Two-Regime Drift in Electrolytically Gated FETs and BioFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wuytens, R. | |
dc.contributor.imecauthor | Santermans, Sybren | |
dc.contributor.imecauthor | Gupta, Mihir | |
dc.contributor.imecauthor | Du Bois, Bert | |
dc.contributor.imecauthor | Severi, Simone | |
dc.contributor.imecauthor | Lagae, Liesbet | |
dc.contributor.imecauthor | Van Roy, Wim | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.orcidimec | Santermans, Sybren::0000-0002-0843-102X | |
dc.contributor.orcidimec | Gupta, Mihir::0000-0003-0286-7997 | |
dc.contributor.orcidimec | Du Bois, Bert::0000-0003-0147-1296 | |
dc.contributor.orcidimec | Van Roy, Wim::0000-0003-3232-1987 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Lagae, Liesbet::0000-0002-1611-6441 | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
dc.source.conferencelocation | Dallas, TX, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |