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Two-Regime Drift in Electrolytically Gated FETs and BioFETs
dc.contributor.author | Wuytens, R. | |
dc.contributor.author | Santermans, S. | |
dc.contributor.author | Gupta, M. | |
dc.contributor.author | Du Bois, B. | |
dc.contributor.author | Seven, S. | |
dc.contributor.author | Lagae, L. | |
dc.contributor.author | Van Roy, W. | |
dc.contributor.author | Martens, K. M. | |
dc.date.accessioned | 2021-11-02T16:05:23Z | |
dc.date.available | 2021-11-02T16:05:23Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200099 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38213 | |
dc.source | WOS | |
dc.title | Two-Regime Drift in Electrolytically Gated FETs and BioFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wuytens, R. | |
dc.contributor.imecauthor | Santermans, S. | |
dc.contributor.imecauthor | Gupta, M. | |
dc.contributor.imecauthor | Du Bois, B. | |
dc.contributor.imecauthor | Seven, S. | |
dc.contributor.imecauthor | Lagae, L. | |
dc.contributor.imecauthor | Van Roy, W. | |
dc.contributor.imecauthor | Martens, K. M. | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
imec.availability | Under review |
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