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A Compact Physics Analytical Model for Hot-Carrier Degradation

dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorGrill, Alexander
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorGrasser, Tibor
dc.contributor.authorHellings, Geert
dc.contributor.authorMakarov, Alexander
dc.contributor.authorJech, Markus
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.date.accessioned2022-01-25T09:02:15Z
dc.date.available2021-11-02T16:05:40Z
dc.date.available2022-01-25T09:02:15Z
dc.date.issued2020
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000612717200030
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38218.2
dc.sourceWOS
dc.titleA Compact Physics Analytical Model for Hot-Carrier Degradation
dc.typeProceedings paper
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.identifier.eisbn978-1-7281-3199-3
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/38218.2*2022-01-25T09:01:01Zvalidation by library/open access desk
120.500.12860/382182021-11-02T16:05:40Z

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