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Low-frequency 1/f noise behaviour of deep submicron n-MOSFETS

dc.contributor.authorSimoen, Eddy
dc.contributor.authorBiesemans, Serge
dc.contributor.authorClaeys, Cor
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorKolarova, Renata
dc.contributor.authorVasina, Petr
dc.contributor.authorSikula, J.
dc.date.accessioned2021-10-14T11:38:41Z
dc.date.available2021-10-14T11:38:41Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3821
dc.sourceIIOimport
dc.titleLow-frequency 1/f noise behaviour of deep submicron n-MOSFETS
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage364
dc.source.endpage367
dc.source.conference15th International Conference on Noise in Physical Systems and 1/f Fluctuations
dc.source.conferencedate23/08/1999
dc.source.conferencelocationHong-Kong
imec.availabilityPublished - open access


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