dc.contributor.author | Bhoir, Mandar S. | |
dc.contributor.author | Chiarella, Thomas | |
dc.contributor.author | Ragnarsson, Lars A. | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Mohapatra, Nihar R. | |
dc.date.accessioned | 2022-01-20T10:18:22Z | |
dc.date.available | 2021-11-02T16:05:56Z | |
dc.date.available | 2022-01-20T10:18:22Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | na | |
dc.identifier.other | WOS:000610825100013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38240.2 | |
dc.source | WOS | |
dc.title | Process-induced V-t variability in nanoscale FinFETs: Does V-t extraction methods have any impact? | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Chiarella, Thomas | |
dc.contributor.imecauthor | Ragnarsson, Lars A. | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.identifier.eisbn | 978-1-7281-2539-8 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE Electron Devices Technology and Manufacturing Conference (EDTM) | |
dc.source.conferencedate | MAR 16-18, 2020 | |
dc.source.conferencelocation | Penang, Malaysia | |
dc.source.journal | na | |
imec.availability | Published - imec | |