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3D-printed optical probes for wafer-level testing of photonic integrated circuits
dc.contributor.author | Trappen, Mareike | |
dc.contributor.author | Blaicher, Matthias | |
dc.contributor.author | Dietrich, Philipp-Immanuel | |
dc.contributor.author | Dankwart, Colin | |
dc.contributor.author | Xu, Yilin | |
dc.contributor.author | Hoose, Tobias | |
dc.contributor.author | Billah, Muhammad Rodlin | |
dc.contributor.author | Abbasi, Amin | |
dc.contributor.author | Baets, Roel | |
dc.contributor.author | Troppenz, Ute | |
dc.contributor.author | Theurer, Michael | |
dc.contributor.author | Woerhoff, Kerstin | |
dc.contributor.author | Seyfried, Moritz | |
dc.contributor.author | Freude, Wolfgang | |
dc.contributor.author | Koos, Christian | |
dc.date.accessioned | 2021-11-02T16:06:29Z | |
dc.date.available | 2021-11-02T16:06:29Z | |
dc.date.issued | 2020-DEC 7 | |
dc.identifier.issn | 1094-4087 | |
dc.identifier.other | WOS:000596707100073 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38277 | |
dc.source | WOS | |
dc.title | 3D-printed optical probes for wafer-level testing of photonic integrated circuits | |
dc.type | Journal article | |
dc.contributor.imecauthor | Abbasi, Amin | |
dc.contributor.imecauthor | Baets, Roel | |
dc.contributor.orcidimec | Baets, Roel::0000-0003-1266-1319 | |
dc.identifier.doi | 10.1364/OE.405139 | |
dc.source.numberofpages | 12 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 37996 | |
dc.source.endpage | 38007 | |
dc.source.journal | OPTICS EXPRESS | |
dc.identifier.pmid | MEDLINE:33379622 | |
dc.source.issue | 25 | |
dc.source.volume | 28 | |
imec.availability | Under review |