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Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
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Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
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Date
1999
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3799.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Ohyama, Hidenori
;
Takami, Y.
;
Sunaga, H.
Journal
Journal of Radioanalytical and Nuclear Chemistry
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1929
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations
Metrics
Views
1929
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations