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Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorTakami, Y.
dc.contributor.authorSunaga, H.
dc.date.accessioned2021-10-14T11:39:22Z
dc.date.available2021-10-14T11:39:22Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3831
dc.sourceIIOimport
dc.titleFactors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage207
dc.source.endpage211
dc.source.journalJournal of Radioanalytical and Nuclear Chemistry
dc.source.issue1
dc.source.volume239
imec.availabilityPublished - open access


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