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Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment
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Authors
De Ridder, Simon
;
Spina, Domenico
;
Toscani, Nicola
;
Grassi, Flavia
;
Vande Ginste, Dries
;
Dhaene, Tom
DOI
10.1109/TEMC.2020.2980790
ISSN
0018-9375
Issue
6
Journal
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume
62
Title
Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment
Publication type
Journal article
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20.500.12860/38350.2
*
2022-01-18T09:58:15Z
validation by library/open access desk
1
20.500.12860/38350
2021-11-02T16:07:13Z
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