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Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment
dc.contributor.author | De Ridder, Simon | |
dc.contributor.author | Spina, Domenico | |
dc.contributor.author | Toscani, Nicola | |
dc.contributor.author | Grassi, Flavia | |
dc.contributor.author | Vande Ginste, Dries | |
dc.contributor.author | Dhaene, Tom | |
dc.date.accessioned | 2021-11-02T16:07:13Z | |
dc.date.available | 2021-11-02T16:07:13Z | |
dc.date.issued | 2020-DEC | |
dc.identifier.issn | 0018-9375 | |
dc.identifier.other | WOS:000599506500023 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38350 | |
dc.source | WOS | |
dc.title | Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Ridder, Simon | |
dc.contributor.imecauthor | Spina, Domenico | |
dc.contributor.imecauthor | Vande Ginste, Dries | |
dc.contributor.imecauthor | Dhaene, Tom | |
dc.contributor.orcidext | Toscani, Nicola::0000-0002-2671-6870 | |
dc.contributor.orcidext | Grassi, Flavia::0000-0001-6844-8766 | |
dc.contributor.orcidimec | Vande Ginste, Dries::0000-0002-0178-288X | |
dc.contributor.orcidimec | Dhaene, Tom::0000-0003-2899-4636 | |
dc.contributor.orcidimec | Spina, Domenico::0000-0003-2379-5259 | |
dc.identifier.doi | 10.1109/TEMC.2020.2980790 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2538 | |
dc.source.endpage | 2546 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | |
dc.source.issue | 6 | |
dc.source.volume | 62 | |
imec.availability | Under review |