Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
View/
open
Published version (880.3Kb)
Metadata
Show full item record
Authors
Ram, Mamidala Karthik
;
Tiwari, Neha
;
Abdi, Dawit
;
Sneh, Saurabh
DOI
10.1109/ACCESS.2021.3125856
ISSN
2169-3536
Issue
na
Journal
IEEE ACCESS
Volume
9
Title
Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
Publication type
Journal article
Collections
Articles
Version history
Version
Item
Date
Summary
3
20.500.12860/38468.3
*
2021-12-07T09:06:43Z
validation by library/open access desk
2
20.500.12860/38468.2
2021-12-07T08:51:39Z
validation by library/open access desk
1
20.500.12860/38468
2021-11-25T02:07:03Z
*Selected version
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login