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Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
Publication:
Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
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Date
2021
Journal article
https://doi.org/10.1109/access.2021.3125856
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ram, Mamidala Karthik
;
Tiwari, Neha
;
Abdi, Dawit
;
Sneh, Saurabh
Journal
IEEE ACCESS
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Downloads
336
since deposited on 2021-11-25
8
last month
2
last week
Acq. date: 2026-08-05
Views
1977
since deposited on 2021-11-25
2
last month
2
last week
Acq. date: 2026-08-05
Citations