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Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
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Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
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Date
2021
Journal article
https://doi.org/10.1109/ACCESS.2021.3125856
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ram, Mamidala Karthik
;
Tiwari, Neha
;
Abdi, Dawit
;
Sneh, Saurabh
Journal
IEEE ACCESS
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1974
since deposited on 2021-11-25
Acq. date: 2025-12-16
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Metrics
Downloads
222
since deposited on 2021-11-25
21
last month
7
last week
Acq. date: 2025-12-16
Views
1974
since deposited on 2021-11-25
Acq. date: 2025-12-16
Citations