Show simple item record

Experimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon

dc.contributor.authorStalmans, Lieven
dc.contributor.authorAbouelsaoud, A. A.
dc.contributor.authorGhannam, Moustafa
dc.contributor.authorPoortmans, Jef
dc.contributor.authorBender, Hugo
dc.contributor.authorCaymax, Matty
dc.contributor.authorNijs, Johan
dc.date.accessioned2021-10-14T11:40:42Z
dc.date.available2021-10-14T11:40:42Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3849
dc.sourceIIOimport
dc.titleExperimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon
dc.typeProceedings paper
dc.contributor.imecauthorGhannam, Moustafa
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage207
dc.source.endpage212
dc.source.conferenceAmorphous and Heterogeneous Silicon Thin Films: Fundamentals to Devices - 1999
dc.source.conferencedate5/04/1999
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
3817.pdf
Size:
413.3Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record