Show simple item record

dc.contributor.authorChen, Rongmei
dc.contributor.authorWeckx, Pieter
dc.contributor.authorSalahuddin, Shairfe Muhammad
dc.contributor.authorKim, Soon-Wook
dc.contributor.authorSisto, Giuliano
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorStucchi, Michele
dc.contributor.authorBaert, Rogier
dc.contributor.authorDebacker, Peter
dc.contributor.authorNa, Myung Hee
dc.contributor.authorRyckaert, Julien
dc.contributor.authorMilojevic, Dragomir
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-12-09T11:20:00Z
dc.date.available2021-12-06T02:06:36Z
dc.date.available2021-12-09T11:20:00Z
dc.date.issued2020
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000717011600017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38552.2
dc.sourceWOS
dc.title3D-optimized SRAM Macro Design and Application to Memory-on-Logic 3D-IC at Advanced Nodes
dc.typeProceedings paper
dc.contributor.imecauthorChen, R.
dc.contributor.imecauthorWeckx, P.
dc.contributor.imecauthorSalahuddin, S. M.
dc.contributor.imecauthorKim, S-W
dc.contributor.imecauthorSisto, G.
dc.contributor.imecauthorVan der Plas, G.
dc.contributor.imecauthorStucchi, M.
dc.contributor.imecauthorBaert, R.
dc.contributor.imecauthorDebacker, P.
dc.contributor.imecauthorNa, M. H.
dc.contributor.imecauthorRyckaert, J.
dc.contributor.imecauthorMilojevic, D.
dc.contributor.imecauthorBeyne, E.
dc.contributor.imecauthorChen, Rongmei
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorSalahuddin, Shairfe Muhammad
dc.contributor.imecauthorKim, Soon-Wook
dc.contributor.imecauthorSisto, Giuliano
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorNa, Myung Hee
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorMilojevic, Dragomir
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecSalahuddin, Shairfe Muhammad::0000-0002-6483-8430
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.identifier.doi10.1109/IEDM13553.2020.9371905
dc.identifier.eisbn978-1-7281-8888-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 12-18, 2020
dc.source.conferencelocationSan Francisco, CA, USA
dc.source.journalna
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

VersionItemDateSummary

*Selected version