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dc.contributor.authorLee, Jiwon
dc.contributor.authorGeorgitzikis, Epimitheas
dc.contributor.authorLi, Yunlong
dc.contributor.authorLin, Ziduo
dc.contributor.authorPark, Jihoon
dc.contributor.authorLieberman, Itai
dc.contributor.authorCheyns, David
dc.contributor.authorJayapala, Murali
dc.contributor.authorLambrechts, Andy
dc.contributor.authorThijs, Steven
dc.contributor.authorStahl, Richard
dc.contributor.authorMalinowski, Pawel
dc.date.accessioned2022-01-12T11:26:18Z
dc.date.available2021-12-06T02:06:49Z
dc.date.available2022-01-12T11:26:18Z
dc.date.issued2020
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000717011600127
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38558.2
dc.sourceWOS
dc.titleImaging in Short-Wave Infrared with 1.82 mu m Pixel Pitch Quantum Dot Image Sensor
dc.typeProceedings paper
dc.contributor.imecauthorLee, Jiwon
dc.contributor.imecauthorGeorgitzikis, Epimitheas
dc.contributor.imecauthorLi, Yunlong
dc.contributor.imecauthorLin, Ziduo
dc.contributor.imecauthorPark, Jihoon
dc.contributor.imecauthorLieberman, Itai
dc.contributor.imecauthorCheyns, David
dc.contributor.imecauthorJayapala, Murali
dc.contributor.imecauthorLambrechts, Andy
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorStahl, Richard
dc.contributor.imecauthorMalinowski, Pawel E.
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.contributor.orcidimecGeorgitzikis, Epimitheas::0000-0001-5972-8328
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.contributor.orcidimecLieberman, Itai::0000-0002-5188-6652
dc.contributor.orcidimecCheyns, David::0000-0002-1327-8752
dc.contributor.orcidimecJayapala, Murali::0000-0001-7917-0149
dc.contributor.orcidimecLambrechts, Andy::0000-0001-7592-2999
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.identifier.doi10.1109/IEDM13553.2020.9372018
dc.identifier.eisbn978-1-7281-8888-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 12-18, 2020
dc.source.conferencelocationSan Francisco, CA, USA
dc.source.journalna
imec.availabilityPublished - imec


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