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Imaging in Short-Wave Infrared with 1.82 mu m Pixel Pitch Quantum Dot Image Sensor
dc.contributor.author | Lee, Jiwon | |
dc.contributor.author | Georgitzikis, Epimitheas | |
dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Lin, Ziduo | |
dc.contributor.author | Park, Jihoon | |
dc.contributor.author | Lieberman, Itai | |
dc.contributor.author | Cheyns, David | |
dc.contributor.author | Jayapala, Murali | |
dc.contributor.author | Lambrechts, Andy | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Stahl, Richard | |
dc.contributor.author | Malinowski, Pawel E. | |
dc.date.accessioned | 2021-12-06T02:06:49Z | |
dc.date.available | 2021-12-06T02:06:49Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000717011600127 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38558 | |
dc.source | WOS | |
dc.title | Imaging in Short-Wave Infrared with 1.82 mu m Pixel Pitch Quantum Dot Image Sensor | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lee, Jiwon | |
dc.contributor.imecauthor | Georgitzikis, Epimitheas | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Lin, Ziduo | |
dc.contributor.imecauthor | Park, Jihoon | |
dc.contributor.imecauthor | Lieberman, Itai | |
dc.contributor.imecauthor | Cheyns, David | |
dc.contributor.imecauthor | Jayapala, Murali | |
dc.contributor.imecauthor | Lambrechts, Andy | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Stahl, Richard | |
dc.contributor.imecauthor | Malinowski, Pawel E. | |
dc.contributor.orcidimec | Lee, Jiwon::0000-0003-3738-4872 | |
dc.contributor.orcidimec | Georgitzikis, Epimitheas::0000-0001-5972-8328 | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Lieberman, Itai::0000-0002-5188-6652 | |
dc.contributor.orcidimec | Cheyns, David::0000-0002-1327-8752 | |
dc.contributor.orcidimec | Jayapala, Murali::0000-0001-7917-0149 | |
dc.contributor.orcidimec | Lambrechts, Andy::0000-0001-7592-2999 | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.identifier.doi | 10.1109/IEDM13553.2020.9372018 | |
dc.identifier.eisbn | 978-1-7281-8888-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 12-18, 2020 | |
imec.availability | Under review |
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