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Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs
Publication:
Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Szelag, B.
;
Kubicek, Stefan
;
De Meyer, Kristin
;
Balestra, F.
Journal
Electronics Letters
Abstract
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1920
since deposited on 2021-10-14
Acq. date: 2025-10-27
Citations
Metrics
Views
1920
since deposited on 2021-10-14
Acq. date: 2025-10-27
Citations