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Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs
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Authors
Szelag, B.
;
Kubicek, Stefan
;
De Meyer, Kristin
;
Balestra, F.
Issue
16
Journal
Electronics Letters
Volume
35
Title
Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs
Publication type
Journal article
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