Publication:
Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs
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1922 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-11
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Metrics
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1922 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-11
Citations