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Characterization of periodic arrays of magnetic dots by x-ray reflectivity experiments

dc.contributor.authorVan Bael, Marleen
dc.contributor.authorTemst, K.
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.contributor.authorJonckheere, Rik
dc.date.accessioned2021-10-14T11:45:19Z
dc.date.available2021-10-14T11:45:19Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3904
dc.sourceIIOimport
dc.titleCharacterization of periodic arrays of magnetic dots by x-ray reflectivity experiments
dc.typeOral presentation
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.source.peerreviewno
dc.source.conference1st Belgian Crystallography Symposium; 28 October 1999; Brussels, Belgium.
dc.source.conferencelocation
imec.availabilityPublished - imec


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