dc.contributor.author | Ceric, H. | |
dc.contributor.author | Selberherr, S. | |
dc.contributor.author | de Orio, R. L. | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Croes, Kristof | |
dc.date.accessioned | 2022-02-23T16:08:26Z | |
dc.date.available | 2022-02-23T16:08:26Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2162-8769 | |
dc.identifier.other | WOS:000626513200001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39071 | |
dc.source | WOS | |
dc.title | Review-Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects | |
dc.type | Journal article review | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.orcidext | Ceric, H.::0000-0003-0918-7732 | |
dc.contributor.orcidext | Selberherr, S.::0000-0002-5583-6177 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.identifier.doi | 10.1149/2162-8777/abe7a9 | |
dc.source.numberofpages | 11 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 035003 | |
dc.source.journal | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | |
dc.source.issue | 3 | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |