dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2022-02-24T09:23:34Z | |
dc.date.available | 2022-02-24T09:23:34Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2158-3226 | |
dc.identifier.other | WOS:000609445500001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39090 | |
dc.source | WOS | |
dc.title | Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Simoen, E.::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
dc.identifier.doi | 10.1063/5.0029833 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 015219 | |
dc.source.journal | AIP ADVANCES | |
dc.source.issue | 1 | |
dc.source.volume | 11 | |
imec.availability | Published - open access | |