Publication:
Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric
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Acq. date: 2026-01-08
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1852 since deposited on 2022-02-24
Acq. date: 2026-01-08
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359 since deposited on 2022-02-24
48last month
8last week
Acq. date: 2026-01-08
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1852 since deposited on 2022-02-24
Acq. date: 2026-01-08
Citations