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Comparison of micro-electronic test structures for noise measurement verification

dc.contributor.authorVan Den Bosch, Sven
dc.contributor.authorDe Ketelaere, Wim
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Vos, Joeri
dc.date.accessioned2021-10-14T11:46:10Z
dc.date.available2021-10-14T11:46:10Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3914
dc.sourceIIOimport
dc.titleComparison of micro-electronic test structures for noise measurement verification
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.source.peerreviewno
dc.source.beginpage40
dc.source.endpage44
dc.source.conferenceProceedings of the 1999 International Conference on Microelectronic Test Structures; 15-18 March 1999; Goteborg, Sweden.
dc.source.conferencelocation
imec.availabilityPublished - imec


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