dc.contributor.author | Priesol, Juraj | |
dc.contributor.author | Satka, Alexander | |
dc.contributor.author | Chvala, Ales | |
dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2022-02-25T13:08:05Z | |
dc.date.available | 2022-02-25T13:08:05Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000603033200017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39150 | |
dc.source | WOS | |
dc.title | Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC Technique | |
dc.type | Journal article | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidext | Satka, Alexander::0000-0001-5004-4536 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.identifier.doi | 10.1109/TED.2020.3039756 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 216 | |
dc.source.endpage | 221 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 1 | |
dc.source.volume | 68 | |
imec.availability | Published - imec | |