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Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC Technique
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Authors
Priesol, Juraj
;
Satka, Alexander
;
Chvala, Ales
;
Stoffels, Steve
;
De Jaeger, Brice
;
Decoutere, Stefaan
DOI
10.1109/TED.2020.3039756
ISSN
0018-9383
Issue
1
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
68
Title
Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC Technique
Publication type
Journal article
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