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dc.contributor.authorVan Den Bosch, Sven
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-10-14T11:46:22Z
dc.date.available2021-10-14T11:46:22Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3916
dc.sourceIIOimport
dc.titleDeriving error bounds on measured noise factors using active device verification
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage116
dc.source.endpage121
dc.source.conferenceProceedings of the 54th ARFTG Conference: Characterization of Broadband Access Technologies
dc.source.conferencedate2/12/1999
dc.source.conferencelocationAtlanta, GA USA
imec.availabilityPublished - open access


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