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A design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuits

dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorCompiet, John
dc.contributor.authorWambacq, P.
dc.contributor.authorDonnay, Stephane
dc.contributor.authorBolsens, Ivo
dc.date.accessioned2021-10-14T11:47:20Z
dc.date.available2021-10-14T11:47:20Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3927
dc.sourceIIOimport
dc.titleA design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuits
dc.typeProceedings paper
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage27
dc.source.endpage32
dc.source.conference1999 Southwest Symposium on Mixed-Signal Design; April 11-13, 1999; Tucson, AZ, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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