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dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorCompiet, John
dc.contributor.authorWambacq, Piet
dc.contributor.authorDonnay, Stephane
dc.contributor.authorEngels, Marc
dc.contributor.authorBolsens, Ivo
dc.date.accessioned2021-10-14T11:47:26Z
dc.date.available2021-10-14T11:47:26Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3928
dc.sourceIIOimport
dc.titleModeling of digital substrate noise generation and experimental verification using a novel substrate noise sensor
dc.typeProceedings paper
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage186
dc.source.endpage189
dc.source.conferenceESSCIRC'99. Proceedings of the 25th European Solid-State Circuits Conference
dc.source.conferencedate21/09/1999
dc.source.conferencelocationDuisburg Germany
imec.availabilityPublished - imec


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