A multi-energy level agnostic simulation approach to defect generation

Abstract

Defect generation during time-dependent dielectric breakdown stress is investigated by a multi-energy level agnostic model. Monte Carlo simulations show that the characteristic power-law increase of the generated defects with stress time is readily obtained when considering distributed bond strengths. DC and AC unipolar simulations show the proportionality between the time-to-breakdown and the fluence and energy of the injected carriers. These results are consistent with the experimental observations of a fluence and energy-driven process in thin oxides.