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28nm pitch single exposure patterning readiness by metal oxide resist on 0.33NA EUV Lithography
Publication:
28nm pitch single exposure patterning readiness by metal oxide resist on 0.33NA EUV Lithography
Date
2021
Proceedings Paper
https://doi.org/10.1117/12.2584713
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Il Hwan
;
Kim, Insung
;
Park, Changmin
;
Lee, Jsiun
;
Ryu, Koungmin
;
De Schepper, P.
;
Doise, J.
;
Kocsis, M.
;
De Simone, Danilo
;
Kljucar, Luka
;
Das, Poulomi
;
Blanc, Romuald
;
Beral, Christophe
;
Severi, Joren
;
Vandenbroeck, Nadia
;
Foubert, Philippe
;
Charley, Anne-Laure
;
Oak, Apoorva
;
Xu, Dongbo
;
Gillijns, Werner
;
Mitard, Jerome
;
Tokei, Zsolt
;
van der Veen, Marleen
;
Heylen, Nancy
;
Teugels, Lieve
;
Le, Quoc Toan
;
Schleicher, Filip
;
Leray, Philippe
;
Ronse, Kurt
Journal
Proceedings of SPIE
Abstract
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2130
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Acq. date: 2025-10-25
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Metrics
Views
2130
since deposited on 2022-03-11
459
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations