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dc.contributor.authorRonchi, Nicolo
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorBreuil, Laurent
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorMcMitchell, Sean
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorMilenin, Alexey
dc.contributor.authorKundu, Shreya
dc.contributor.authorPak, Murat
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2022-03-14T11:58:34Z
dc.date.available2022-03-14T11:58:34Z
dc.date.issued2021
dc.identifier.issn2161-4636
dc.identifier.otherWOS:000712433900011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39445
dc.sourceWOS
dc.titleFerroelectric FET with Gd-doped HfO2: A Step Towards Better Uniformity and Improved Memory Performance
dc.typeProceedings paper
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorMcMitchell, Sean
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorMilenin, Alexey
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorPak, Murat
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecMilenin, Alexey::0000-0003-0747-0462
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.identifier.doi10.1109/SNW51795.2021.00012
dc.identifier.eisbn978-4-86348-781-9
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.beginpage21
dc.source.endpage22
dc.source.conference26th Silicon Nanoelectronics Workshop
dc.source.conferencedateJUN 13, 2021
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


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