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Reliable extraction of RF figures-of-merit for MOSFETs

dc.contributor.authorVandamme, Ewout
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorvan Dinther, Cees
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorDeferm, Ludo
dc.date.accessioned2021-10-14T11:49:00Z
dc.date.available2021-10-14T11:49:00Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3944
dc.sourceIIOimport
dc.titleReliable extraction of RF figures-of-merit for MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorDeferm, Ludo
dc.source.peerreviewno
dc.source.beginpage660
dc.source.endpage663
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
dc.source.conferencelocation
imec.availabilityPublished - imec


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