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Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress
dc.contributor.author | Lee, Kookjin | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Kruv, Anastasiia | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Okudur, Oguzhan Orkut | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2022-03-26T02:08:24Z | |
dc.date.available | 2022-03-26T02:08:24Z | |
dc.date.issued | 2022-MAR 8 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000767811600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39531 | |
dc.source | WOS | |
dc.title | Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lee, Kookjin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Okudur, Oguzhan Orkut | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.orcidimec | Lee, Kookjin::0000-0002-9896-1090 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Gonzalez, Mario::0000-0003-4374-4854 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Okudur, Oguzhan Orkut::0000-0002-4790-7772 | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.identifier.doi | 10.1109/TED.2022.3154341 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
imec.availability | Under review |
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