Publication:

Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3154341
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Accepted version 870.16 KB

Author(s)

Lee, Kookjin  
;
Kaczer, Ben  
;
Kruv, Anastasiia  
;
Gonzalez, Mario  
;
Eneman, Geert  
;
Okudur, Oguzhan Orkut  
;
Grill, Alexander  
;
De Wolf, Ingrid  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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1543 since deposited on 2022-03-26
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1766 since deposited on 2022-03-26
222last month
76last week
Acq. date: 2026-01-12

Views

1543 since deposited on 2022-03-26
6last month
2last week
Acq. date: 2026-01-12

Citations