Publication:

Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3154341
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 870.16 KB

Author(s)

Lee, Kookjin  
;
Kaczer, Ben  
;
Kruv, Anastasiia  
;
Gonzalez, Mario  
;
Eneman, Geert  
;
Okudur, Oguzhan Orkut  
;
Grill, Alexander  
;
De Wolf, Ingrid  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

Description

Statistics

Downloads

2151 since deposited on 2022-03-26
266last month
58last week
Acq. date: 2026-02-25

Views

1547 since deposited on 2022-03-26
3last month
Acq. date: 2026-02-25

Citations

Statistics

Downloads

2151 since deposited on 2022-03-26
266last month
58last week
Acq. date: 2026-02-25

Views

1547 since deposited on 2022-03-26
3last month
Acq. date: 2026-02-25

Citations