Publication:

Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3154341
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Author(s)

Lee, Kookjin  
;
Kaczer, Ben  
;
Kruv, Anastasiia  
;
Gonzalez, Mario  
;
Eneman, Geert  
;
Okudur, Oguzhan Orkut  
;
Grill, Alexander  
;
De Wolf, Ingrid  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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3011 since deposited on 2022-03-26
305last month
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1554 since deposited on 2022-03-26
3last month
1last week
Acq. date: 2026-05-18

Citations