dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Clarysse, Trudo | |
dc.contributor.author | Trenkler, Thomas | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Eyben, Pierre | |
dc.contributor.author | Haegeman, Bart | |
dc.contributor.author | Stephenson, Robert | |
dc.contributor.author | De Wolf, Peter | |
dc.date.accessioned | 2021-10-14T11:50:48Z | |
dc.date.available | 2021-10-14T11:50:48Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3962 | |
dc.source | IIOimport | |
dc.title | Probing semiconductor devices on the nanometer schale | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | no | |
dc.source.beginpage | 46 | |
dc.source.endpage | 55 | |
dc.source.conference | ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |