dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Roggen, Jean | |
dc.contributor.author | Caers, J. | |
dc.contributor.author | Van Veen, C. | |
dc.date.accessioned | 2021-10-14T11:51:11Z | |
dc.date.available | 2021-10-14T11:51:11Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3966 | |
dc.source | IIOimport | |
dc.title | Thermo-mechanical reliability optimisation of small sized SMD components | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 88 | |
dc.source.endpage | 92 | |
dc.source.journal | VTE - Aufbau und Verbindungstechnik in der Electronik | |
dc.source.issue | 2 | |
imec.availability | Published - imec | |