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dc.contributor.authorVandevelde, Bart
dc.contributor.authorBeyne, Eric
dc.contributor.authorRoggen, Jean
dc.contributor.authorCaers, J.
dc.contributor.authorVan Veen, C.
dc.date.accessioned2021-10-14T11:51:11Z
dc.date.available2021-10-14T11:51:11Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3966
dc.sourceIIOimport
dc.titleThermo-mechanical reliability optimisation of small sized SMD components
dc.typeJournal article
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewno
dc.source.beginpage88
dc.source.endpage92
dc.source.journalVTE - Aufbau und Verbindungstechnik in der Electronik
dc.source.issue2
imec.availabilityPublished - imec


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