dc.contributor.author | Gallardo, Jethro Oroceo | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Dash, Sachidananda | |
dc.contributor.author | Tang, Shun-Wei | |
dc.contributor.author | Tran, Thanh Nga | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Wu, Tian-Li | |
dc.date.accessioned | 2022-05-03T10:07:21Z | |
dc.date.available | 2022-04-28T02:12:48Z | |
dc.date.available | 2022-05-03T10:07:21Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1946-1550 | |
dc.identifier.other | WOS:000782378200039 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39690.2 | |
dc.source | WOS | |
dc.title | Stability of Schottky Barrier Diode Integrated in p-GaN Enhancement-mode GaN Power Technology | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.identifier.doi | 10.1109/IPFA53173.2021.9617330 | |
dc.identifier.eisbn | 978-1-6654-3988-6 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) | |
dc.source.conferencedate | SEP 14-OCT 13, 2021 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | na | |
imec.availability | Published - imec | |