dc.contributor.author | Duflou, Rutger | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Afzalian, Aryan | |
dc.date.accessioned | 2022-04-28T15:24:14Z | |
dc.date.available | 2022-04-28T15:24:14Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1946-1569 | |
dc.identifier.other | WOS:000766985400023 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39701 | |
dc.source | WOS | |
dc.title | Electron-phonon scattering in cold-metal contacted two-dimensional semiconductor devices | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Duflou, Rutger | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Afzalian, Aryan | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Duflou, Rutger::0000-0002-0357-1293 | |
dc.contributor.orcidimec | Afzalian, Aryan::0000-0002-5260-0281 | |
dc.date.embargo | 2023-09-30 | |
dc.identifier.doi | 10.1109/SISPAD54002.2021.9592538 | |
dc.identifier.eisbn | 978-1-6654-0685-7 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 94 | |
dc.source.endpage | 97 | |
dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) | |
dc.source.conferencedate | SEP 27-29, 2021 | |
dc.source.conferencelocation | Dallas | |
dc.source.journal | na | |
imec.availability | Published - open access | |