dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-05-03T09:30:12Z | |
dc.date.available | 2022-05-01T02:12:04Z | |
dc.date.available | 2022-05-03T09:27:33Z | |
dc.date.available | 2022-05-03T09:30:12Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1089-3539 | |
dc.identifier.other | WOS:000783792400016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39719.3 | |
dc.source | WOS | |
dc.title | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/ITC50571.2021.00022 | |
dc.identifier.eisbn | 978-1-6654-1695-5 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.beginpage | 143 | |
dc.source.endpage | 152 | |
dc.source.conference | IEEE International Test Conference (ITC) | |
dc.source.conferencedate | OCT 10-15, 2021 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | na | |
imec.availability | Published - open access | |